X光粉末繞射儀
| 簡稱 | XRD |
|---|---|
| 英文名稱 | X-ray Diffractometer |
| 功能說明 | 本儀器為新一代粉末繞射儀，具有多樣檢測功能，且提供不需要使用冷卻水來冷卻偵測器的新穎設計。對於全校學術研究功能性應用在金屬材料、電子材料、陶瓷材料、復合材料、孔洞材料、生物材料、奈米材料等多晶性樣品。提供之繞射圖可用於鑑定晶格參數、粒子大小及已知物對比。 |
| 購置日期 | 103.07.14 |
| 購置金額 | 3,850,000元 |
| 廠牌 | Bruker |
| 型號 | D8 ADVANCE ECO |
| 儀器規格 | ●Standard cabinet, enclosure, controller, 1kW, 1kW Generator with internal cooling unit ●Rotating sample stage with universal cup, alignment slit and Corundum sample ●Scatter screen for P01, P02, P04, P08, P26 ●SSD160 detector ●X-ray tube KFF-Cu-2K, fine focus, 0.04 x 8 -- 0.4 ●4-axes motor driver board ●DIFFRAC.MEASUREMENT CENTER for universities, quoted with instrument ●DIFFRAC.EVA for universities, quoted with instrument ●WIBU Dongle for DIFFRAC.SUITE |
