Function

This instrument is a new generation of powder diffractometer with various detection functions and a novel design that does not require cooling water to cool the detector. For the functional application of academic research in the whole school, the polycrystalline samples such as metal materials, electronic materials, ceramic materials, composite materials, porous materials, biomaterials, and nanomaterials can provide diffraction patterns to identify lattice parameters, particle sizes, or due to The sample suitable for TEM observation needs to be extremely thin (about 50nm) to ensure the penetration of the electron beam. Therefore, for softer materials (such as biomedicine, biological patterns, polymer materials), only ultra-thin slicers can be used. To cut such a thin test piece. The solid sample can also be cut with an ultra-thin microtome for TEM observation. than the known.

Purchase Date

Purchase Amount

NT 3,000,000

Label

Label

Label

Ultrathin section is a sample preparation tool for transmission electron microscope (TEM), which can cut to a thickness of less than 100nm.